DIFFRACTION GRATING CHARACTERIZATION VIA THE EXCITATION OF SURFACE-PLASMONS

被引：20

作者：

BRYANBROWN, GP ^{[1
]}

JORY, MC ^{[1
]}

ELSTON, SJ ^{[1
]}

SAMBLES, JR ^{[1
]}

机构：

[1] UNIV EXETER,DEPT PHYS,THIN FILM & INTERFACE GRP,EXETER EX4 4QL,DEVON,ENGLAND

来源：

JOURNAL OF MODERN OPTICS | 1993年 / 40卷 / 05期

关键词：

D O I：

10.1080/09500349314550961

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A diffraction grating has been manufactured in silica using interferometry and then replicated into perspex. Both grating profiles have then been characterized by fitting theory to experimentally obtained surface plasmon resonances excited on the grating surfaces after they had been coated with silver. The groove profile in the silica grating is distorted from purely sinusoidal. This distortion is very well characterized using the second-order surface plasmon and is described in this study a simple one-parameter model. The validity of the model is confirmed by similar examination of the surface plasmon resonances from the replica which is found to have the almost exactly the opposite distortion.

引用

页码：959 / 964

页数：6

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