COAXIAL ELECTRON LENSES

[1] A ZONALLY CORRECTED ELECTRON LENS [J]. NATURE, 1946, 158 (4006) : 198 - 198

[2] Gabor D, 1945, PROC R SOC LON SER-A, V183, P0436, DOI 10.1098/rspa.1945.0012

[3] GABOR D, 1945, ELECTRON MICROSCOPE, pCH7

[4] GABOR D, 1945, Patent No. 22053

[5] THE MOUNTING OF BACTERIA FOR ELECTRON MICROSCOPE EXAMINATION [J]. JOURNAL OF BACTERIOLOGY, 1946, 52 (04) : 411 - 416

[6] FURTHER IMPROVEMENT IN THE RESOLVING POWER OF THE ELECTRON MICROSCOPE [J]. JOURNAL OF APPLIED PHYSICS, 1946, 17 (04) : 307 - 309

[7] COMPLETE COMPUTATION OF ELECTRON OPTICAL SYSTEMS [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1946, 58 (325): : 30 - 41

[8] PICARD E, 1894, TRAITE ANAL, V2

[9] Over some errors of electrons lenses. [J]. ZEITSCHRIFT FUR PHYSIK, 1936, 101 (05): : 593 - 603

[10] Southwell R., 1940, RELAXATION METHODS E

[1] A ZONALLY CORRECTED ELECTRON LENS [J]. NATURE, 1946, 158 (4006) : 198 - 198

[2] Gabor D, 1945, PROC R SOC LON SER-A, V183, P0436, DOI 10.1098/rspa.1945.0012

[3] GABOR D, 1945, ELECTRON MICROSCOPE, pCH7

[4] GABOR D, 1945, Patent No. 22053

[5] THE MOUNTING OF BACTERIA FOR ELECTRON MICROSCOPE EXAMINATION [J]. JOURNAL OF BACTERIOLOGY, 1946, 52 (04) : 411 - 416

[6] FURTHER IMPROVEMENT IN THE RESOLVING POWER OF THE ELECTRON MICROSCOPE [J]. JOURNAL OF APPLIED PHYSICS, 1946, 17 (04) : 307 - 309

[7] COMPLETE COMPUTATION OF ELECTRON OPTICAL SYSTEMS [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1946, 58 (325): : 30 - 41

[8] PICARD E, 1894, TRAITE ANAL, V2

[9] Over some errors of electrons lenses. [J]. ZEITSCHRIFT FUR PHYSIK, 1936, 101 (05): : 593 - 603

[10] Southwell R., 1940, RELAXATION METHODS E