SERIES RESISTANCE CAUSED BY THE LOCALIZED REAR CONTACT IN HIGH-EFFICIENCY SILICON SOLAR-CELLS

被引：27

作者：

ZHAO, JH

WANG, AH

GREEN, MA

机构：

[1] Centre for Photovoltaic Devices and Systems, University of New South Wales, Kensington

来源：

SOLAR ENERGY MATERIALS AND SOLAR CELLS | 1994年 / 32卷 / 01期

基金：

澳大利亚研究理事会;

关键词：

D O I：

10.1016/0927-0248(94)90258-5

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

High efficiency PERL (passivated emitter and rear locally-diffused) cells have demonstrated over 700 mV open-circuit voltage and 23% efficiency under standard test conditions. However, the relatively low fill factor is the main parameter limiting performance. This paper analyses the series resistance caused by the localized rear contact design. This resistance is found not to limit the performance of one-sun PERL cells, even though it does become significant for concentrator PERL cells.

引用

页码：89 / 94

页数：6

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