THE MEASUREMENT OF ATOMIC-NUMBER AND COMPOSITION IN AN SEM USING BACKSCATTERED DETECTORS

被引：49

作者：

BALL, MD ^{[1
]}

MCCARTNEY, DG ^{[1
]}

机构：

[1] UNIV OXFORD,DEPT MET & SCI MAT,OXFORD,ENGLAND

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1981年 / 124卷 / OCT期

关键词：

D O I：

10.1111/j.1365-2818.1981.tb01305.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：57 / 68

页数：12

共 21 条

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[5] DANGUY L, 1956, J PHYS RADIUM, V16, P320
[6] HEINRICH KFJ, 1964, ADV XRAY ANAL, V7, P325
[7] HOHN FJ, 1976, ELECTRON MICROSC JER, V1, P380
[8] HOHN FJ, 1976, ELECTRON MICROSC JER, V1, P383
[9] HUTCHINSON WB, 1980, METALLURGIST MAT JUL
[10] THE STRUCTURES EXPECTED IN A SIMPLE TERNARY EUTECTIC SYSTEM .1. THEORY
MCCARTNEY, DG
HUNT, JD
JORDAN, RM
[J]. METALLURGICAL TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 1980, 11 (08): : 1243 - 1249