DOUBLE BETA-DECAY OF SE-82

被引：125

作者：

ELLIOTT, SR ^{[1
]}

HAHN, AA ^{[1
]}

MOE, MK ^{[1
]}

NELSON, MA ^{[1
]}

VIENT, MA ^{[1
]}

机构：

[1] UNIV CALIF IRVINE, DEPT PHYS, IRVINE, CA 92717 USA

来源：

PHYSICAL REVIEW C | 1992年 / 46卷 / 04期

关键词：

D O I：

10.1103/PhysRevC.46.1535

中图分类号：

O57 [原子核物理学、高能物理学];

学科分类号：

070202 ;

摘要：

The two-neutrino double beta decay of Se-82 has been measured during a 20 244 h run resulting in a half-life of 1.08(-0.06)+0.26 X 10(20) years (68% C.L.). No candidate events for the zero-neutrino double beta decay during 21 924 h results in a half-life limit of 2.7 X 10(22) years at the 68% confidence level.

引用

页码：1535 / 1537

页数：3

共 15 条

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