CONTROLLABILITY-OBSERVABILITY ANALYSIS OF DIGITAL CIRCUITS

被引：165

作者：

GOLDSTEIN, LH

机构：

[1] Division 2113, Sandia Laboratories, Albuquerque

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS | 1979年 / 26卷 / 09期

关键词：

D O I：

10.1109/TCS.1979.1084687

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The testability of a digital circuit is directly related to the difficulty of controlling and observing the logical values of internal nodes from circuit inputs and outputs respectively. This paper presents a method for analyzing digital circuits in terms of six functions which characterize combinational and sequential controllability and observability. © 1979 IEEE

引用

页码：685 / 693

页数：9

共 8 条

[1]

BARSI F, 1976, IEEE T COMPUT, V25, P585, DOI 10.1109/TC.1976.1674658

[2]

BREUER, 177 TEST80 ATG REP

[3] LAMP - CONTROLLABILITY, OBSERVABILITY, AND MAINTENANCE ENGINEERING TECHNIQUE (COMET) [J].

CHANG, HY ;

HEIMBIGNER, GW .

BELL SYSTEM TECHNICAL JOURNAL, 1974, 53 (08) :1505-1534

[4]

DEJKA WJ, 1977, 20TH P MIDW S CIRC S, P39

[5]

EICHELBERGER EB, 1977, 14TH P DES AUT C, P462

[6]

KEINER WL, 1977, NOV AUTOTESTCON 77

[7]

PARKER KP, 1975, IEEE T COMPUTERS JUN, P668

[8]

STEPHENSON JE, 1976, 6TH P FAULT TOL COMP, P101

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