POWER SPECTRUM MEASUREMENT OF A MODULATED SEMICONDUCTOR-LASER USING AN INTERFEROMETRIC SELF-HOMODYNE TECHNIQUE - INFLUENCE OF QUANTUM PHASE NOISE AND FIELD CORRELATION

被引：8

作者：

BANEY, DM

GALLION, PB

机构：

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1989年 / 25卷 / 10期

关键词：

D O I：

10.1109/3.35722

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：2106 / 2112

页数：7

共 39 条

[1] POWER SPECTRUM OF DIRECTLY MODULATED SINGLE-MODE SEMICONDUCTOR-LASERS - CHIRP-INDUCED FINE-STRUCTURE [J].

AGRAWAL, GP .

IEEE JOURNAL OF QUANTUM ELECTRONICS, 1985, 21 (06) :680-686

[2] THEORY OF INTERFEROMETRIC ANALYSIS OF LASER PHASE NOISE [J].

ARMSTRONG, JA .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1966, 56 (08) :1024-+

[3] ROLE OF PETERMANN K-FACTOR IN SEMICONDUCTOR-LASER OSCILLATORS [J].

ARNAUD, J .

ELECTRONICS LETTERS, 1985, 21 (12) :538-539

[4] MEASUREMENT OF A MODULATED DFB LASER SPECTRUM USING GATED DELAYED SELF-HOMODYNE TECHNIQUE [J].

BANEY, DM ;

SORIN, WV .

ELECTRONICS LETTERS, 1988, 24 (11) :669-670

[5] REDUCTION OF LASER CHIRP IN 1.5-MU-M DFB LASERS BY MODULATION PULSE SHAPING [J].

BICKERS, L ;

WESTBROOK, LD .

ELECTRONICS LETTERS, 1985, 21 (03) :103-104

[6] DYNAMIC LINE BROADENING OF SEMICONDUCTOR-LASERS MODULATED AT HIGH-FREQUENCIES [J].

BUUS, J .

ELECTRONICS LETTERS, 1985, 21 (04) :129-131

[7] DEPENDENCE OF CHIRPING ON CAVITY SEPARATION IN 2-SECTION COUPLED-CAVITY LASERS [J].

COLDREN, LA ;

BOYD, GD ;

BURRUS, CA .

ELECTRONICS LETTERS, 1985, 21 (12) :527-528

[8] PHASE NOISE AND SPECTRAL-LINE SHAPE IN SEMICONDUCTOR-LASERS [J].

DAINO, B ;

SPANO, P ;

TAMBURRINI, M ;

PIAZZOLLA, S .

IEEE JOURNAL OF QUANTUM ELECTRONICS, 1983, 19 (03) :266-270

[9] INFLUENCE OF CARRIER NONUNIFORMITY ON THE PHASE RELATIONSHIP BETWEEN FREQUENCY AND INTENSITY MODULATION IN SEMICONDUCTOR-LASERS [J].

DOYLE, O ;

GALLION, PB ;

DEBARGE, G .

IEEE JOURNAL OF QUANTUM ELECTRONICS, 1988, 24 (03) :516-522

[10] INTRINSIC LINESHAPE AND FM RESPONSE OF MODULATED SEMICONDUCTOR-LASERS [J].

EICHEN, E ;

MELMAN, P ;

NELSON, WH .

ELECTRONICS LETTERS, 1985, 21 (19) :849-850

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