HIGH-INTENSITY LOW TUBE-VOLTAGE X-RAY SOURCE FOR LABORATORY EXTENDED X-RAY ABSORBED FINE-STRUCTURE MEASUREMENTS - COMMENT

被引：2

作者：

SAKURAI, K ^{[1
]}

SAKURAI, H ^{[1
]}

机构：

[1] RIGAKU DENKI CO,AKISHIMA,TOKYO 196,JAPAN

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1994年 / 65卷 / 07期

关键词：

D O I：

10.1063/1.1144701

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In the cited article, an x-ray source developed for extended x-ray absorption fine structure measurements is described. After the publication, the authors have further improved the performance by employing a compact rotating anode and by optimizing an electron gun. This new x-ray generator provides high tube current of 1100 mA at 18 kV with the narrow focal spot of about 0.1 mm in width. Extremely intense monochromatic x rays, which are completely free from higher order reflections, are now available in a laboratory, and the measurement time required for a practical sample has been shortened to less than 2 h.

引用

页码：2417 / 2417

页数：1

共 8 条

[1] DEVELOPMENT OF A LABORATORY EXAFS FACILITY [J].