OPTICAL RESISTANCE OF SAPPHIRE

被引:8
作者
CHMEL, A
ERONKO, SB
KONDYREV, AM
NAZAROVA, VY
机构
[1] A. F. Ioffe Physico-Technical Institute, Academy of Sciences of Russia, St Petersburg
关键词
D O I
10.1007/BF00414257
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Single-crystals of alpha-Al2O3 were subjected to multi-stage polishing with diamond powder of successively decreasing grain size. After each stage of polishing, the infrared reflection spectra were recorded and the nanosecond laser resistance at 1.06 mum was measured. The laser-induced damage data were also obtained for natural face, annealed and ion-etched surfaces. It was shown that (i) disorder of the crystal structure affects the optical resistance, resulting in a decrease of damage threshold, and (ii) the surface layer disturbed by grinding retains a ''memory'' of the initial structure. The multi-pulse sub-threshold laser irradiation which leads, finally, to macroscopic damage of a sample, stimulates the process of structural ordering, together with the formation of ''dangerous'' local defects.
引用
收藏
页码:4673 / 4680
页数:8
相关论文
共 15 条
[1]  
ALTSHULER VM, 1983, FIZ KHIM OBRABOTKI M, V6, P174
[2]  
BABIJCHUK IP, 1988, OPTIKO MECH PROM SOV, V3, P57
[3]   MEASURE OF SURFACE DEFECTIVENESS AND OPTICAL STRENGTH OF TRANSPARENT DIELECTRICS. [J].
Bebchuk, A.S. ;
Gromov, D.A. ;
Nechitailo, V.S. .
Soviet Journal of Quantum Electronics (English translation of Kvantovaya Elektronika), 1976, 6 (08) :986-987
[4]   ROLE OF CRACKS, PORES, AND ABSORBING INCLUSIONS ON LASER-INDUCED DAMAGE THRESHOLD AT SURFACES OF TRANSPARENT DIELECTRICS [J].
BLOEMBERGEN, N .
APPLIED OPTICS, 1973, 12 (04) :661-664
[5]  
CHMEL A, 1992, POVERKHNOST, V1, P137
[6]  
DOVGAN ME, 1976, FIZ KHIM STEKLA SOV, V4, P146
[8]  
GLEBOVSKY AA, 1989, IZV AN SSSR FIZ+, V53, P568
[9]   MULTIPLE PULSE LASER-INDUCED DAMAGE PHENOMENA IN SILICATES [J].
KITRIOTIS, D ;
MERKLE, LD .
APPLIED OPTICS, 1989, 28 (05) :949-958
[10]   COMMON APPROACH TO THE PROBLEM OF DEFECT NUCLEATION IN SOLIDS UNDER PRE-THRESHOLD LASER IRRADIATION [J].
KUSOV, A ;
KONDYREV, A ;
CHMEL, A .
JOURNAL OF PHYSICS-CONDENSED MATTER, 1990, 2 (18) :4067-4080