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THE ISOPHOT CREA25 FAR INFRARED SI-P MATRIX
被引:3
作者
:
DIERICKX, B
论文数:
0
引用数:
0
h-index:
0
机构:
BATTELLE INST,D-6000 FRANKFURT,FED REP GER
BATTELLE INST,D-6000 FRANKFURT,FED REP GER
DIERICKX, B
[
1
]
VERMEIREN, J
论文数:
0
引用数:
0
h-index:
0
机构:
BATTELLE INST,D-6000 FRANKFURT,FED REP GER
BATTELLE INST,D-6000 FRANKFURT,FED REP GER
VERMEIREN, J
[
1
]
FRENZL, O
论文数:
0
引用数:
0
h-index:
0
机构:
BATTELLE INST,D-6000 FRANKFURT,FED REP GER
BATTELLE INST,D-6000 FRANKFURT,FED REP GER
FRENZL, O
[
1
]
机构
:
[1]
BATTELLE INST,D-6000 FRANKFURT,FED REP GER
来源
:
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
|
1989年
/ 275卷
/ 03期
关键词
:
D O I
:
10.1016/0168-9002(89)90738-9
中图分类号
:
TH7 [仪器、仪表];
学科分类号
:
0804 ;
080401 ;
081102 ;
摘要
:
引用
收藏
页码:527 / 529
页数:3
相关论文
共 4 条
[1]
INFLUENCE OF SUBSTRATE FREEZE-OUT ON THE CHARACTERISTICS OF MOS-TRANSISTORS AT VERY LOW-TEMPERATURES
[J].
BALESTRA, F
论文数:
0
引用数:
0
h-index:
0
机构:
CEA,IRDI,CEN GRENOBLE,LAB ELECTR & TECHNOL INFORMAT,INFRAROUGE LAB,F-38041 GRENOBLE,FRANCE
CEA,IRDI,CEN GRENOBLE,LAB ELECTR & TECHNOL INFORMAT,INFRAROUGE LAB,F-38041 GRENOBLE,FRANCE
BALESTRA, F
;
AUDAIRE, L
论文数:
0
引用数:
0
h-index:
0
机构:
CEA,IRDI,CEN GRENOBLE,LAB ELECTR & TECHNOL INFORMAT,INFRAROUGE LAB,F-38041 GRENOBLE,FRANCE
CEA,IRDI,CEN GRENOBLE,LAB ELECTR & TECHNOL INFORMAT,INFRAROUGE LAB,F-38041 GRENOBLE,FRANCE
AUDAIRE, L
;
LUCAS, C
论文数:
0
引用数:
0
h-index:
0
机构:
CEA,IRDI,CEN GRENOBLE,LAB ELECTR & TECHNOL INFORMAT,INFRAROUGE LAB,F-38041 GRENOBLE,FRANCE
CEA,IRDI,CEN GRENOBLE,LAB ELECTR & TECHNOL INFORMAT,INFRAROUGE LAB,F-38041 GRENOBLE,FRANCE
LUCAS, C
.
SOLID-STATE ELECTRONICS,
1987,
30
(03)
:321
-327
[2]
MODEL FOR HYSTERESIS AND KINK BEHAVIOR OF MOS-TRANSISTORS OPERATING AT 4.2-K
[J].
DIERICKX, B
论文数:
0
引用数:
0
h-index:
0
机构:
IMEC VZW,KAPELDREEF 75,B-3030 LEUVEN,BELGIUM
IMEC VZW,KAPELDREEF 75,B-3030 LEUVEN,BELGIUM
DIERICKX, B
;
WARMERDAM, L
论文数:
0
引用数:
0
h-index:
0
机构:
IMEC VZW,KAPELDREEF 75,B-3030 LEUVEN,BELGIUM
IMEC VZW,KAPELDREEF 75,B-3030 LEUVEN,BELGIUM
WARMERDAM, L
;
SIMOEN, E
论文数:
0
引用数:
0
h-index:
0
机构:
IMEC VZW,KAPELDREEF 75,B-3030 LEUVEN,BELGIUM
IMEC VZW,KAPELDREEF 75,B-3030 LEUVEN,BELGIUM
SIMOEN, E
;
VERMEIREN, J
论文数:
0
引用数:
0
h-index:
0
机构:
IMEC VZW,KAPELDREEF 75,B-3030 LEUVEN,BELGIUM
IMEC VZW,KAPELDREEF 75,B-3030 LEUVEN,BELGIUM
VERMEIREN, J
;
CLAEYS, C
论文数:
0
引用数:
0
h-index:
0
机构:
IMEC VZW,KAPELDREEF 75,B-3030 LEUVEN,BELGIUM
IMEC VZW,KAPELDREEF 75,B-3030 LEUVEN,BELGIUM
CLAEYS, C
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1988,
35
(07)
:1120
-1125
[3]
ENGEMANN D, 1988, 4TH CIPR4 INT C INFR
[4]
LEMKE D, 1985, SPIE P, V589, P181
←
1
→
共 4 条
[1]
INFLUENCE OF SUBSTRATE FREEZE-OUT ON THE CHARACTERISTICS OF MOS-TRANSISTORS AT VERY LOW-TEMPERATURES
[J].
BALESTRA, F
论文数:
0
引用数:
0
h-index:
0
机构:
CEA,IRDI,CEN GRENOBLE,LAB ELECTR & TECHNOL INFORMAT,INFRAROUGE LAB,F-38041 GRENOBLE,FRANCE
CEA,IRDI,CEN GRENOBLE,LAB ELECTR & TECHNOL INFORMAT,INFRAROUGE LAB,F-38041 GRENOBLE,FRANCE
BALESTRA, F
;
AUDAIRE, L
论文数:
0
引用数:
0
h-index:
0
机构:
CEA,IRDI,CEN GRENOBLE,LAB ELECTR & TECHNOL INFORMAT,INFRAROUGE LAB,F-38041 GRENOBLE,FRANCE
CEA,IRDI,CEN GRENOBLE,LAB ELECTR & TECHNOL INFORMAT,INFRAROUGE LAB,F-38041 GRENOBLE,FRANCE
AUDAIRE, L
;
LUCAS, C
论文数:
0
引用数:
0
h-index:
0
机构:
CEA,IRDI,CEN GRENOBLE,LAB ELECTR & TECHNOL INFORMAT,INFRAROUGE LAB,F-38041 GRENOBLE,FRANCE
CEA,IRDI,CEN GRENOBLE,LAB ELECTR & TECHNOL INFORMAT,INFRAROUGE LAB,F-38041 GRENOBLE,FRANCE
LUCAS, C
.
SOLID-STATE ELECTRONICS,
1987,
30
(03)
:321
-327
[2]
MODEL FOR HYSTERESIS AND KINK BEHAVIOR OF MOS-TRANSISTORS OPERATING AT 4.2-K
[J].
DIERICKX, B
论文数:
0
引用数:
0
h-index:
0
机构:
IMEC VZW,KAPELDREEF 75,B-3030 LEUVEN,BELGIUM
IMEC VZW,KAPELDREEF 75,B-3030 LEUVEN,BELGIUM
DIERICKX, B
;
WARMERDAM, L
论文数:
0
引用数:
0
h-index:
0
机构:
IMEC VZW,KAPELDREEF 75,B-3030 LEUVEN,BELGIUM
IMEC VZW,KAPELDREEF 75,B-3030 LEUVEN,BELGIUM
WARMERDAM, L
;
SIMOEN, E
论文数:
0
引用数:
0
h-index:
0
机构:
IMEC VZW,KAPELDREEF 75,B-3030 LEUVEN,BELGIUM
IMEC VZW,KAPELDREEF 75,B-3030 LEUVEN,BELGIUM
SIMOEN, E
;
VERMEIREN, J
论文数:
0
引用数:
0
h-index:
0
机构:
IMEC VZW,KAPELDREEF 75,B-3030 LEUVEN,BELGIUM
IMEC VZW,KAPELDREEF 75,B-3030 LEUVEN,BELGIUM
VERMEIREN, J
;
CLAEYS, C
论文数:
0
引用数:
0
h-index:
0
机构:
IMEC VZW,KAPELDREEF 75,B-3030 LEUVEN,BELGIUM
IMEC VZW,KAPELDREEF 75,B-3030 LEUVEN,BELGIUM
CLAEYS, C
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1988,
35
(07)
:1120
-1125
[3]
ENGEMANN D, 1988, 4TH CIPR4 INT C INFR
[4]
LEMKE D, 1985, SPIE P, V589, P181
←
1
→