NONDESTRUCTIVE LEAF-AREA ESTIMATION IN BANANA

被引：31

作者：

POTDAR, MV ^{[1
]}

PAWAR, KR ^{[1
]}

机构：

[1] MARATHWADA AGR UNIV,DEPT AGRON,PARBHANI 431402,MAHARASHTRA,INDIA

来源：

SCIENTIA HORTICULTURAE | 1991年 / 45卷 / 3-4期

关键词：

BANANA; LEAF AREA; LINEAR MEASUREMENTS; REGRESSION MODELS;

D O I：

10.1016/0304-4238(91)90070-F

中图分类号：

S6 [园艺];

学科分类号：

0902 ;

摘要：

A rapid, non-destructive and precise method for leaf area determination in 'Ardhapuri' and 'Basrai' cultivars of banana was developed from linear measurements. A strong correlation existed between leaf area (LA) and various combinations of leaf length (L) and width (W). LA can be predicted precisely with the regression models LA = 0.0334 + (LXWX0.8402) (r = 0.96) for 'Ardhapuri' and LA = 0.0266 + (LXWX0.7629) (r = 0.98) for 'Basrai'.

引用

页码：251 / 254

页数：4

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