PREPARATION AND CHARACTERIZATION OF LATERALLY HETEROGENEOUS POLYMER MODIFIED ELECTRODES USING INSITU ATOMIC FORCE MICROSCOPY

被引：23

作者：

BRUMFIELD, JC ^{[1
]}

GOSS, CA ^{[1
]}

IRENE, EA ^{[1
]}

MURRAY, RW ^{[1
]}

机构：

[1] UNIV N CAROLINA, KENAN LABS CHEM, CHAPEL HILL, NC 27599 USA

来源：

LANGMUIR | 1992年 / 8卷 / 11期

关键词：

D O I：

10.1021/la00047a038

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

This paper describes the use of tip-perturbation effects in atomic force microscopy (AFM) to pattern thin films of in situ electrochemically-formed polymers. Applications of this technique to fabricate microelectrodes and junctions between the edges of very thin, dissimilar polymer films are presented. These are the first examples of spatially patterned, laterally heterogeneous polymer films having thicknesses in the 5-200-run range.

引用

页码：2810 / 2817

页数：8

共 23 条

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