X-RAY-DIFFRACTION STUDY OF MICROSTRUCTURE OF HEXAGONAL CLOSE-PACKED ZINC FILMS .1. FILMS VACUUM EVAPORATED AT OBLIQUE-INCIDENCE

被引：14

作者：

SEN, S

NANDI, RK

SENGUPTA, SP

机构：

来源：

THIN SOLID FILMS | 1978年 / 48卷 / 01期

关键词：

D O I：

10.1016/0040-6090(78)90326-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1 / 16

页数：16

共 28 条

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[9] X-RAY-DIFFRACTION PROFILE ANALYSIS OF VACUUM-EVAPORATED COPPER-FILMS - NORMAL AND OBLIQUE VAPOR INCIDENCE [J].

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[10]

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