OPTICAL CHARACTERIZATION OF POLYETHYLENE FILMS BY REFRACTOMETRY

被引：7

作者：

BERNABEU, E ^{[1
]}

BOIX, JM ^{[1
]}

LARENA, A ^{[1
]}

PINTO, G ^{[1
]}

机构：

[1] UNIV POLITECN MADRID,ETSI IND,DEPT INGN QUIM IND,E-28006 MADRID,SPAIN

来源：

JOURNAL OF MATERIALS SCIENCE | 1993年 / 28卷 / 21期

关键词：

Anisotropy - Crystal structure - Light refraction - Mathematical models - Optical variables measurement - Plastic films - Polarized light - Refractive index - Refractometers - Surface properties;

D O I：

10.1007/BF00365188

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Refractometrical measurements of polyethylene films have been obtained using a modified Abbe's refractometer that includes polarized and monochromatic light. The ordinary and extraordinary refractive index values have been obtained considering an anisotropic uniaxic model. These values are analysed in relation to the previously known degree of crystallinity in the samples of this material. The specular reflectance is derived from the Fresnel formulae and an evaluation of diffused reflectance has been made. We find that the diffuse reflectance values increase with average roughness of the polyethylene films. This question is of particular interest for the surface characterization of these materials.

引用

页码：5826 / 5830

页数：5

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