LIFETIMES AND CROSS-SECTIONS OF LASER LEVELS OF XENON MEASURED BY HANLE EFFECT

被引:12
作者
SUZUKI, T [1 ]
SHIMODA, K [1 ]
机构
[1] UNIV TOKYO,FAC SCI,DEPT PHYS,TOKYO 113,JAPAN
关键词
D O I
10.1143/JPSJ.43.233
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:233 / 242
页数:10
相关论文
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