A SWEPT 2-FREQUENCY MICROWAVE REFLECTOMETER FOR EDGE DENSITY PROFILE MEASUREMENTS ON TFTR

被引：19

作者：

HANSON, GR ^{[1
]}

WILGEN, JB ^{[1
]}

BIGELOW, TS ^{[1
]}

COLLAZO, I ^{[1
]}

THOMAS, CE ^{[1
]}

机构：

[1] OAK RIDGE NATL LAB,OAK RIDGE,TN 37831

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1992年 / 63卷 / 10期

关键词：

D O I：

10.1063/1.1143654

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The edge density profile can play a significant role in determining the plasma confinement and the coupling of the ion cyclotron resonance frequency (ICRF) heating power to the plasma. To experimentally measure the edge density profile in the Tokamak Fusion Test Facility (TFTR), a two-frequency microwave reflectometer is being built. This reflectometer will operate in a swept two-frequency configuration between 91 and 118 GHz using the extraordinary mode. The frequency separation between the two microwave signals will be held constant while the signals are swept across the frequency band. By measuring the differential phase delay between these two signals, the density profile can be reconstructed. Two-frequency profile reflectometry is discussed and results of modeling of this type of reflectometer measurement for TFTR are shown. Finally, the design of the TFTR edge profile reflectometer microwave system is described.

引用

页码：4658 / 4660

页数：3