HIGH-PRECISION SOFT-X-RAY REFLECTOMETER

被引:74
作者
FUCHS, D
KRUMREY, M
MULLER, P
SCHOLZE, F
ULM, G
机构
[1] Physikalisch-Technische Bundesanstalt, D-10587 Berlin
关键词
7;
D O I
10.1063/1.1145720
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
At the radiometry laboratory of the Physikalisch-Technische Bundesanstalt (PTB) a reflectometer for the soft x-ray spectral region has been operated for several years utilizing monochromatic radiation of a toroidal grating monochromator or a high-resolution plane grating monochromator. The monochromators cover the photon energy region from 35 to 1500 eV. New challenges due to the development of soft x-ray optical components led to the design of a second reflectometer with advanced capabilities. Samples with a diameter of up to 250 mm can be accommodated. The time required for sample exchange is reduced by using a lock chamber. The feasibility of sample positioning with high precision has been improved. Typical uncertainties of about 1%-2%, e.g., for the reflectance of multilayer mirrors, can be achieved. A detailed description of the reflectometer as well as some typical results showing the performance are presented. © 1995 American Institute of Physics.
引用
收藏
页码:2248 / 2250
页数:3
相关论文
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