HIGH-RESOLUTION ELECTRON-MICROSCOPY OF PLANAR DEFECTS AND DISLOCATION IN BA2YCU3OY

被引:31
作者
MATSUI, Y [1 ]
TAKAYAMAMUROMACHI, E [1 ]
KATO, K [1 ]
机构
[1] NATL INST RES INORGAN MAT,TSUKUBA,IBARAKI 305,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1988年 / 27卷 / 03期
关键词
D O I
10.1143/JJAP.27.L350
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:L350 / L353
页数:4
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