INSTRUMENTAL ASPECTS OF IMAGE ANALYSIS IN ELECTRON-MICROSCOPE

被引：10

作者：

MULVEY, T ^{[1
]}

机构：

[1] UNIV ASTON,DEPT PHYS,BIRMINGHAM B4 7ET,ENGLAND

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1973年 / 98卷 / AUG期

关键词：

D O I：

10.1111/j.1365-2818.1973.tb03831.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：232 / 250

页数：19

共 52 条

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[10] CONVOLUTION CAMERA TO REVEAL PERIODICITIES IN ELECTRON MICROGRAPHS [J].

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