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METALLURGICAL APPLICATIONS OF SECONDARY ION MASS-SPECTROMETRY (SIMS)

被引：29
作者：
DEGREVE, F
THORNE, NA
LANG, JM
机构：
来源：
JOURNAL OF MATERIALS SCIENCE | 1988年 / 23卷 / 12期
关键词：
D O I：
10.1007/BF00551909
中图分类号：
T [工业技术];
学科分类号：
08 [工学];
摘要：
引用
收藏
页码：4181 / 4208
页数：28
相关论文
共 69 条
[1]
ANDERSEN CA, 1973, MICROPROBE ANAL, P531
[2]
BECKER GH, 1986, 5 P SIMS C, P85
[3]
Benninghoven A., 1976, Critical Reviews in Solid State Sciences, V6, P291, DOI 10.1080/10408437608243561
[4]
ANALYSIS OF MONOMOLECULAR LAYERS OF SOLIDS BY SECONDARY ION EMISSION [J].
BENNINGHOVEN, A .
ZEITSCHRIFT FUR PHYSIK, 1970, 230 (05) :403-+
[5]
Benninghoven A., 1987, SECONDARY ION MASS S
[6]
EVALUATION OF ION MICROSCOPIC SPATIAL-RESOLUTION AND IMAGE QUALITY [J].
BERNIUS, MT ;
LING, YC ;
MORRISON, GH .
ANALYTICAL CHEMISTRY, 1986, 58 (01) :94-101
[7]
BINNING G, 1982, APPL PHYS LETT, V40, P2178
[8]
ADSORPTION OF GASES STUDIED BY SECONDARY ION EMISSION MASS-SPECTROMETRY [J].
BLAISE, G ;
BERNHEIM, M .
SURFACE SCIENCE, 1975, 47 (01) :324-343
[9]
BORCHARDT G, 1981, MIKROCHIM ACTA, V2, P421
[10]
BOWER TF, 1966, T METALL SOC AIME, V236, P624
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