CHARACTERIZATION AND MEASUREMENT OF BASE AND EMITTER RESISTANCES OF BIPOLAR TRANSISTORS

被引：51

作者：

SANSEN, WMC

MEYER, RG

机构：

来源：

关键词：

D O I：

10.1109/JSSC.1972.1050324

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：492 / &

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