SECONDARY EMISSION STATISTICS THEIR APPLICATION TO WINDOWLESS MULTIPLIERS

[1] AN IMPROVED ELECTRON MULTIPLIER PARTICLE COUNTER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1947, 18 (10) : 739 - 749

[2] BRAULT M, 1963, CR HEBD ACAD SCI, V256, P1241

[3] BRAULT M, 1963, CR HEBD ACAD SCI, V256, P6

[4] BRUNET M, 1963, J PHYS APPL, V24, pA53

[5] BRUNET M, 1962, LONDE ELECTR, P42

[6] BRUNET M, 1962, LONDE ELECTR, P746

[7] BRUNET M, CEA

[8] SCINTILLATION TYPE MASS SPECTROMETER ION DETECTOR [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1960, 31 (03) : 264 - 267

[9] STATISTICS OF ELECTRON MULTIPLICATION [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1961, 32 (02) : 200 - &

[10] MORTON GA, 1948, RCA REV, V9, P632

[1] AN IMPROVED ELECTRON MULTIPLIER PARTICLE COUNTER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1947, 18 (10) : 739 - 749

[2] BRAULT M, 1963, CR HEBD ACAD SCI, V256, P1241

[3] BRAULT M, 1963, CR HEBD ACAD SCI, V256, P6

[4] BRUNET M, 1963, J PHYS APPL, V24, pA53

[5] BRUNET M, 1962, LONDE ELECTR, P42

[6] BRUNET M, 1962, LONDE ELECTR, P746

[7] BRUNET M, CEA

[8] SCINTILLATION TYPE MASS SPECTROMETER ION DETECTOR [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1960, 31 (03) : 264 - 267

[9] STATISTICS OF ELECTRON MULTIPLICATION [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1961, 32 (02) : 200 - &

[10] MORTON GA, 1948, RCA REV, V9, P632