INDIVIDUAL-DEFECT ELECTROMIGRATION IN METAL NANOBRIDGES

被引：106

作者：

RALLS, KS

RALPH, DC

BUHRMAN, RA

机构：

来源：

PHYSICAL REVIEW B | 1989年 / 40卷 / 17期

关键词：

D O I：

10.1103/PhysRevB.40.11561

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：11561 / 11570

页数：10

共 21 条

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