GROWTH OF DYBA2CU3O7-X STUDIED BY SCANNING TUNNELING MICROSCOPY

被引：7

作者：

CHANDRASEKHAR, N ^{[1
]}

AGRAWAL, V ^{[1
]}

ACHUTHARAMAN, VS ^{[1
]}

GOLDMAN, AM ^{[1
]}

机构：

[1] UNIV MINNESOTA, SCH PHYS & ASTRON, MINNEAPOLIS, MN 55455 USA

来源：

APPLIED PHYSICS LETTERS | 1992年 / 60卷 / 19期

关键词：

D O I：

10.1063/1.106993

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Scanning tunneling microscopy (STM) has been used to investigate the microstructure of DyBa2CU3O7-x films grown on (100) SrTiO3 by ozone-assisted molecular beam epitaxy. The surface roughness is found to be higher than that reported for sputtered films of YBa2CU3O7-x. Intensity oscillations were observed in the specular spot of in situ reflection high energy electron diffraction patterns, a result which suggests that surface smoothness is not a requisite for the observation of such intensity oscillations. The observation of spiral morphology in STM pictures indicates the presence of screw dislocations, in excess of 10(9) cm-2. A zeroth order approximation has been used to evaluate the shapes of the spirals and reasonable agreement is obtained with experiment.

引用

页码：2424 / 2426

页数：3

共 11 条

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