RECOMBINATION PROCESSES AND PHOTOLUMINESCENCE INTENSITY IN QUANTUM-WELLS UNDER STEADY-STATE AND TRANSIENT CONDITIONS

被引:22
作者
BRANDT, O
KANAMOTO, K
GOTODA, M
ISU, T
TSUKADA, N
机构
[1] Semiconductor Research Laboratory, Mitsubishi Electric Corporation, Amagasaki, Hyogo 661, 1-1
来源
PHYSICAL REVIEW B | 1995年 / 51卷 / 11期
关键词
D O I
10.1103/PhysRevB.51.7029
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We present a theoretical and experimental study of recombination processes in quantum wells. Our model calculations, which include free-excitonic, free-carrier, and defect-mediated nonradiative recombination, describe the dependence of the photoluminescence intensity on excitation density under steady-state conditions and on time under transient conditions. For the former conditions, it is not, in principle, possible to distinguish between excitonic and free-carrier contributions to the photoluminescence intensity. However, an accurate determination of the relative weight of nonradiative and radiative contributions can be made. For transient conditions, on the other hand, excitonic contributions may be identified, while the discrimination between radiative and nonradiative contributions isthough possiblepossessed with ambiguities. We finally apply our model to a set of experimental data, taken at 300 K from a single In0.1Ga0.9As/Al0.33Ga0.67As quantum well under both steady-state and transient conditions. The results of this analysis demonstrate the consistency of our model and its potential for the quantitative understanding of the recombination dynamics in quantum wells. © 1995 The American Physical Society.
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页码:7029 / 7037
页数:9
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