IDENTIFICATION OF POSITIVE SECONDARY IONS IN STATIC SIMS SPECTRA OF POLY(METHYLMETHACRYLATE) USING THE DEUTERATED POLYMER

被引：31

作者：

BRINKHUIS, RHG ^{[1
]}

VANOOIJ, WJ ^{[1
]}

机构：

[1] COLORADO SCH MINES,DEPT CHEM,GOLDEN,CO 80401

来源：

SURFACE AND INTERFACE ANALYSIS | 1988年 / 11卷 / 04期

关键词：

D O I：

10.1002/sia.740110406

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

收藏

页码：214 / 216

页数：3

相关论文

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[3] A COMPARISON OF POSITIVE AND NEGATIVE-ION STATIC SIMS SPECTRA OF POLYMER SURFACES
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