IMPURITY CONCENTRATIONS ON METAL-SURFACES BY AUGER-ELECTRON SPECTROSCOPY

被引:17
作者
UEDA, K [1 ]
SHIMIZU, R [1 ]
机构
[1] OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,SUITA,OSAKA,JAPAN
关键词
D O I
10.1016/0039-6028(73)90422-6
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:789 / 796
页数:8
相关论文
共 17 条
[1]   ESTIMATES OF EFFICIENCIES OF PRODUCTION AND DETECTION OF ELECTRON-EXCITED AUGER EMISSION [J].
BISHOP, HE ;
RIVIERE, JC .
JOURNAL OF APPLIED PHYSICS, 1969, 40 (04) :1740-&
[2]   CONTAMINANTS ON CHEMICALLY ETCHED SILICON SURFACES - LEED-AUGER METHOD [J].
CHANG, CC .
SURFACE SCIENCE, 1970, 23 (02) :283-&
[3]  
Charig J. M., 1970, Surface Science, V19, P283, DOI 10.1016/0039-6028(70)90039-7
[4]   LEED OBSERVATIONS OF CALIBRATED EPITAXIAL NICKEL FILMS ON (111) COPPER) [J].
HAQUE, CA ;
FARNSWORTH, HE .
SURFACE SCIENCE, 1966, 4 (02) :195-+
[5]  
KOSHIKAWA T, 1972, TECHNOL REPT OSAKA U, V22, P51
[6]  
MACDONALD NC, 1971, 4 P ANN SCANN EL M 1, P88
[7]  
MOTT NF, 1961, THEORY ATOMIC COLLIS
[8]   AUGER ELECTRON SPECTROSCOPY OF FCC METAL SURFACES [J].
PALMBERG, PW ;
RHODIN, TN .
JOURNAL OF APPLIED PHYSICS, 1968, 39 (05) :2425-&
[9]   QUANTITATIVE USE OF AUGER SPECTROSCOPY - CALIBRATION OF METHOD [J].
PERDEREAU, M .
SURFACE SCIENCE, 1971, 24 (01) :239-+
[10]   AUGER SPECTRA OF COPPER-NICKEL ALLOYS [J].
QUINTO, DT ;
ROBERTSON, WD ;
SUNDARAM, VS .
SURFACE SCIENCE, 1971, 28 (02) :504-+