HIGH-VOLTAGE ELECTRON MICROSCOPY

被引：5

作者：

COSSLETT, VE

机构：

来源：

PHYSICS TODAY | 1968年 / 21卷 / 07期

关键词：

D O I：

10.1063/1.3035052

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

British, French, Japanese and US teams added accelerators to electron microscopes. Now voltages ten times conventional levels permit viewing of thicker, more representative specimens. © 1968, American Institute of Physics. All rights reserved.

引用

页码：23 / &

共 27 条

[1] BAHR GF, 1965, QUANTITATIVE ELEC ED, P359
[2] ELECTRON MICROSCOPY AT HIGH BEAM ACCELERATING VOLTAGES
BURGE, RE
SMITH, GH
[J]. NATURE, 1962, 195 (4837) : 140 - &
[3] COSSLETT VE, 1967, OPTIK, V25, P383
[4] CURTIS GC, IN PRESS
[5] DUPOUY G, 1960, CR HEBD ACAD SCI, V251, P2836
[6] DUPOUY G, 1965, CR HEBD ACAD SCI, V261, P4649
[7] DUPOUY G, 1964, CR HEBD ACAD SCI, V258, P4213
[8] DUPOUY G, 1961, CR HEBD ACAD SCI, V253, P2435
[9] DUPOUY G, 1962, J MICROSCOPIE, V1, P167
[10] DUPOUY G, 1968, ADVANCES OPTICAL ELE, V2, P167

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