BIASED SECONDARY-ELECTRON IMAGING IN A UHV-STEM

被引：39

作者：

HEMBREE, GG ^{[1
]}

CROZIER, PA ^{[1
]}

DRUCKER, JS ^{[1
]}

KRISHNAMURTHY, M ^{[1
]}

VENABLES, JA ^{[1
]}

COWLEY, JM ^{[1
]}

机构：

[1] UNIV SUSSEX,SCH MAPS,BRIGHTON BN1 9QH,E SUSSEX,ENGLAND

来源：

关键词：

D O I：

10.1016/0304-3991(89)90040-5

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：111 / 115

页数：5

共 11 条

[1] VISUALIZATION OF SUBMONOLAYERS AND SURFACE-TOPOGRAPHY BY BIASED SECONDARY-ELECTRON IMAGING - APPLICATION TO AG LAYERS ON SI AND W SURFACES
FUTAMOTO, M
HANBUCKEN, M
HARLAND, CJ
JONES, GW
VENABLES, JA
[J]. SURFACE SCIENCE, 1985, 150 (02) : 430 - 450
[2] HARLAND CJ, 1987, SCANNING MICROSCOP S, V1, P109
[3] HEMBREE GG, 1988, 46TH P ANN EMSA M, P666
[4] SECONDARY-ELECTRON DETECTION IN THE SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
IMESON, D
MILNE, RH
BERGER, SD
MCMULLAN, D
[J]. ULTRAMICROSCOPY, 1985, 17 (03) : 243 - 249
[5] HIGH-SPATIAL-RESOLUTION SURFACE-SENSITIVE ELECTRON-SPECTROSCOPY USING A MAGNETIC PARALLELIZER
KRUIT, P
VENABLES, JA
[J]. ULTRAMICROSCOPY, 1988, 25 (03) : 183 - 193
[6] SURFACE MICROSCOPY WITH SCANNED ELECTRON-BEAMS
VENABLES, JA
BATCHELOR, DR
HANBUCKEN, M
HARLAND, CJ
JONES, GW
[J]. PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1986, 318 (1541): : 243 - +
[7] HREM, STEM, REM, SEM - AND STM
VENABLES, JA
SMITH, DJ
COWLEY, JM
[J]. SURFACE SCIENCE, 1987, 181 (1-2) : 235 - 249
[8] VENABLES JA, 1988, IN PRESS P NATO ARW
[9] VENABLES JA, 1987, I PHYS C SER, V90, P85
[10] REFLECTION ELECTRON-ENERGY LOSS SPECTROSCOPY (REELS) - A TECHNIQUE FOR THE STUDY OF SURFACES
WANG, ZL
COWLEY, JM
[J]. SURFACE SCIENCE, 1988, 193 (03) : 501 - 512