X-RAY HOLOGRAPHIC INTERFEROMETRY IN DETERMINATION OF PLANAR MULTILAYER STRUCTURES - THEORY AND EXPERIMENTAL OBSERVATIONS

被引：31

作者：

LESSLAUER, W

BLASIE, JK

机构：

来源：

关键词：

D O I：

10.1107/S0567739471001001

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：456 / +

页数：1

共 8 条

[1] TREATMENT OF LOW ANGLE X-RAY DATA FROM PLANAR AND CONCENTRIC MULTILAYERED STRUCTURES
BLAUROCK, AE
WORTHINGTON, CR
[J]. BIOPHYSICAL JOURNAL, 1966, 6 (03) : 305 - +
[2] Films built by depositing successive monomolecular layers on a solid surface
Blodgett, KB
[J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1935, 57 (01) : 1007 - 1022
[3] HOSEMANN R, 1962, DIRECT ANALYSIS DIFF, P122
[4] LESSLAUER W, IN PRESS
[5] MULTILAYERS OF PHOSPHOLIPID BIMOLECULAR LEAFLETS
LEVINE, YK
BAILEY, AI
WILKINS, MHF
[J]. NATURE, 1968, 220 (5167) : 577 - &
[6] Luzzati V., 1968, BIOL MEMBR, P71
[7] SMITH HM, 1969, PRINCIPLES HOLOGRAPH, P19
[8] X-RAY MICROSCOPY BY SUCCESSIVE FOURIER TRANSFORMATION
WINTHROP, JT
WORTHINGTON, CR
[J]. PHYSICS LETTERS, 1965, 15 (02): : 124 - +