X-RAY-SENSITIVITY OF SELENIUM

被引：20

作者：

DONOVAN, JL

机构：

[1] Research Laboratories, Eastman Kodak Company, Rochester

来源：

JOURNAL OF APPLIED PHYSICS | 1979年 / 50卷 / 10期

关键词：

D O I：

10.1063/1.325745

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The charge-generation energy for commerical selenium xeroradiographic plates has been measured. A new technique based on x-ray-induced photocurrents was used as well as conventional xeroradiographic discharge measurements. Using x-ray spectra typical of medical x-ray irradiations at a conventional applied field of 10 V/μm, a charge-generation energy of 30-40 eV per pair was determined. Theoretical estimates related to the band gap predict a pair-creation energy of 7 eV per pair for selenium.

引用

页码：6500 / 6504

页数：5

共 15 条

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