FIRST-ORDER SENSITIVITY AND WORST CASE ANALYSIS OF DOUBLY TERMINATED REACTANCE 2-PORTS

被引：37

作者：

TEMES, GC ^{[1
]}

ORCHARD, HJ ^{[1
]}

机构：

[1] UNIV CALIF,SCH ENGN & APPL SCI,DEPT ELECT SCI & ENGN,LOS ANGELES,CA 90024

来源：

IEEE TRANSACTIONS ON CIRCUIT THEORY | 1973年 / CT20卷 / 05期

关键词：

D O I：

10.1109/TCT.1973.1083717

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：567 / 571

页数：5

共 10 条

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[3] Darlington S., 1939, J MATH PHYS, V18, P257, DOI DOI 10.1002/SAPM1939181257
[4] KISHI G, 1967, IEEE T CIRCUIT THEOR, VCT14, P380
[5] KISHI G, 1963, IEEE T CIRCUITS SYST, VCT10, P67
[6] MATTHES H, 1968, IEEE T CIRCUITS SYST, VCT15, P145
[7] SENSITIVITY ANALYSIS OF LOSSLESS 2 PORTS BY UNIFORM VARIATIONS OF ELEMENT VALUES
NEIRYNCK, J
THIRAN, JP
[J]. ELECTRONICS LETTERS, 1967, 3 (02) : 74 - &
[8] Orchard HJ, 1966, ELECTRON LETT, V2, P224, DOI [10.1049/el:19660190, DOI 10.1049/EL:19660190]
[9] TEMES G, 1962, IRE T CIRCUIT THEORY, VCT 9, P385
[10] EFFECTS OF SEMIUNIFORM LOSSES IN REACTANCE 2-PORTS
TEMES, GC
[J]. ELECTRONICS LETTERS, 1972, 8 (06) : 161 - &