HIGH-ENERGY X-RAY MICROSCOPY WITH MULTILAYER REFLECTORS

[1] COSSLETT VE, 1961, XRAY MICROSCOPY

[2] Franks A., 1985, Proceedings of the SPIE - The International Society for Optical Engineering, V563, P81, DOI 10.1117/12.949655

[3] HOWELLS MC, UNPUB PHYS TODAY

[4] Jentzsch F., 1929, PHYS ZEIT, V30, P268

[5] FORMATION OF OPTICAL IMAGES BY X-RAYS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1948, 38 (09) : 766 - 774

[6] MARSHALL GF, 1985, P SOC PHOTOOPT INSTR, V563

[7] MCGEE JF, 1957, XRAY MICROSCOPY MICR, P164

[8] PRICE RH, 1981, AIP C P, V75, P189

[9] ROSENBLUTH A, 1983, THESIS U ROCHESTER

[10] CALIBRATED 4-COLOR X-RAY MICROSCOPE FOR LASER PLASMA DIAGNOSTICS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1976, 47 (04) : 464 - 470

[1] COSSLETT VE, 1961, XRAY MICROSCOPY

[2] Franks A., 1985, Proceedings of the SPIE - The International Society for Optical Engineering, V563, P81, DOI 10.1117/12.949655

[3] HOWELLS MC, UNPUB PHYS TODAY

[4] Jentzsch F., 1929, PHYS ZEIT, V30, P268

[5] FORMATION OF OPTICAL IMAGES BY X-RAYS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1948, 38 (09) : 766 - 774

[6] MARSHALL GF, 1985, P SOC PHOTOOPT INSTR, V563

[7] MCGEE JF, 1957, XRAY MICROSCOPY MICR, P164

[8] PRICE RH, 1981, AIP C P, V75, P189

[9] ROSENBLUTH A, 1983, THESIS U ROCHESTER

[10] CALIBRATED 4-COLOR X-RAY MICROSCOPE FOR LASER PLASMA DIAGNOSTICS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1976, 47 (04) : 464 - 470