SUPERCONDUCTING TRANSPORT PROPERTIES OF STEP-EDGE JOSEPHSON JUNCTIONS

被引：24

作者：

Schmidl, F. ^{[1
]}

Alff, L. ^{[1
]}

Gross, R. ^{[1
]}

Husemann, K. -D. ^{[1
]}

Schneidewind, H. ^{[2
]}

Seidel, P. ^{[2
]}

机构：

[1] Univ Tubingen, Phys Inst, Lehrstuhl Expt Phys 2, Morgenstelle 14,W-7400, Tubingen, Germany

[2] Univ Jena, Inst Festkorperphys, Helmholtzstr 5, D-06900 Jena, Germany

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1993年 / 3卷 / 01期

关键词：

D O I：

10.1109/77.233430

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We have investigated the electrical transport properties of YBa2Cu3O7-delta step-edge junctions (SEJs) fabricated on step edges in (100) SrTiO3 substrates. In particular, we studied the influence of the step angle and the ratio of the step height and the film thickness on the superconducting properties of the junctions. Steps of different height and angle were patterned into (100) SrTiO3 substrates by ion beam etching (IBE). Epitaxial YBa2Cu3O7-delta films were grown on these substrates by sputtering and patterned by IBE. The samples were characterized by four-probe electrical measurements. The critical current density of the SEJs was found to depend strongly on the ratio of the step height to the film thickness. The critical current density distribution of the SEJs was imaged by Low Temperature Scanning Electron Microscopy (LTSEM) and was found to be strongly inhomogeneous.

引用

页码：2349 / 2352

页数：4

共 11 条

[1]

Alff L., PHYSICA C IN PRESS

[2] SUBSTRATE STEP-EDGE YBA2CU3O7 RF SQUIDS [J].

DALY, KP ;

DOZIER, WD ;

BURCH, JF ;

COONS, SB ;

HU, R ;

PLATT, CE ;

SIMON, RW .

APPLIED PHYSICS LETTERS, 1991, 58 (05) :543-545

[3] LOW 1/F NOISE SINGLE-LAYER YBA2CU3OX DC SQUID AT 77 K [J].

FRIEDL, G ;

VILDIC, M ;

ROAS, B ;

UHL, D ;

BOMMEL, F ;

ROMHELD, M ;

HILLENBRAND, B ;

STRITZKER, B ;

DAALMANS, G .

APPLIED PHYSICS LETTERS, 1992, 60 (24) :3048-3050

[4] SPATIAL IMAGING OF THE CRITICAL CURRENT-DENSITY IN EPITAXIAL Y1BA2CU3O7 FILMS [J].

GROSS, R ;

HIPLER, K ;

MANNHART, J ;

HUEBENER, RP ;

CHAUDHARI, P ;

DIMOS, D ;

TSUEI, CC ;

SCHUBERT, J ;

POPPE, U .

APPLIED PHYSICS LETTERS, 1989, 55 (20) :2132-2134

[5] THERMALLY ACTIVATED PHASE SLIPPAGE IN HIGH-TC GRAIN-BOUNDARY JOSEPHSON-JUNCTIONS [J].

GROSS, R ;

CHAUDHARI, P ;

DIMOS, D ;

GUPTA, A ;

KOREN, G .

PHYSICAL REVIEW LETTERS, 1990, 64 (02) :228-231

[6]

Gross R., 1992, GRAIN BOUNDARY JOSEP

[7]

Jia C.L., 1992, PHYSICA C UNPUB

[8]

Mayer B., 1992, APPL PHYS LETT UNPUB

[9]

Seidel P., 1992, P ASC 92 CHIC UNPUB

[10]

Siegel M., 1991, P 4 IC SQUID 91 BERL, P138

← 1 2 →