LOW-ANGLE ELECTRON-DIFFRACTION WITH ELMISKOP 101 ELECTRON-MICROSCOPE

被引：7

作者：

ARMIGLIA.A ^{[1
]}

MERLI, PG ^{[1
]}

RUFFINI, G ^{[1
]}

机构：

[1] CONSIGLIO NAZL RICERCHE,LAMEL,BOLOGNA 40126,ITALY

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1973年 / 6卷 / 01期

关键词：

D O I：

10.1088/0022-3735/6/1/019

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：35 / 39

页数：5

共 10 条

[1] INSTRUMENTAL DATA FOR ELMISKOP-101 ELECTRON MICROSCOPE
ARMIGLIATO, A
VALDRE, U
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1971, 4 (11): : 829 - +
[2] LOW-ANGEL SCATTERING IN ELECTRON MICROSCOPE - APPLICATION TO POLYMERS
BASSETT, GA
KELLER, A
[J]. PHILOSOPHICAL MAGAZINE, 1964, 9 (101): : 817 - &
[3] RESOLUTION IN LOW-ANGLE ELECTRON DIFFRACTION
DRAHOS, V
DELONG, A
[J]. NATURE, 1966, 209 (5025) : 801 - &
[4] Ferrier R. P., 1969, ADV OPT ELECTRON MIC, V3, P155
[5] FERRIER RP, 1964, 3 P EUR REG C EM PRA, P115
[6] MERLI PG, 1970, 7 P INT C EL MICR GR, V1, P589
[7] A NEW METHOD FOR INVESTIGATING ELECTRIC FIELD REGIONS OF P-N JUNCTIONS
TITCHMARSH, JM
LAPWORTH, AJ
BOOKER, GR
[J]. PHYSICA STATUS SOLIDI, 1969, 34 (02): : K83 - +
[8] TITCHMARSH JM, 1971, THESIS U OXFORD
[9] SMALL ANGLE ELECTRON SCATTERING FROM VACUUM CONDENSED METALLIC FILMS
WADE, RH
SILCOX, J
[J]. PHYSICA STATUS SOLIDI, 1967, 19 (01): : 57 - &
[10] WADE RH, 1966, EL319 CENG TECHN NOT