XPS ON IMPREGNATED CATHODES - SURFACE CONCENTRATIONS AND THERMAL-STABILITY

被引：9

作者：

VANVEEN, NJA

机构：

[1] Phillips Research Lab, Eindhoven, Neth, Phillips Research Lab, Eindhoven, Neth

来源：

APPLIED SURFACE SCIENCE | 1987年 / 29卷 / 01期

关键词：

SPECTROSCOPY; X-RAY - SURFACES - Spectroscopic Analysis;

D O I：

10.1016/0169-4332(87)90019-5

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Photoelectron spectra are presented for S, M and scandate cathodes before and after the activation procedure. Using the calculatory method and the Ba deposition method, the Ba coverages for the S, M and Sc cathodes have been established as 4. 0 multiplied by 10**1**4, 5. 8 multiplied by 10**1**4 and 5. 8 multiplied by 10**1**4 Ba atoms cm** minus **2, respectively. On the Os-Ru cathode an enhancement of the Ru concentration is found which may be due to segregation. In addition, a brief study was made of the thermal stability of the Ba overlayer and its regeneration. It appears that after a heating cycle to 1200 degree C and S and M cathodes recover very well, whereas the Sc cathode suffers from the loss of Sc, which is inherently connected with the fine emission properties of this cathode.

引用

页码：113 / 126

页数：14

共 30 条

[1]

Band I. M., 1979, Atomic Data and Nuclear Data Tables, V23, P443, DOI 10.1016/0092-640X(79)90027-5

[2] RELATIVE PHOTOELECTRON SIGNAL INTENSITIES OBTAINED WITH A MAGNESIUM X-RAY SOURCE [J].

BERTHOU, H ;

JORGENSEN, CK .

ANALYTICAL CHEMISTRY, 1975, 47 (03) :482-488

[3] RELATIVE INTRA-ELEMENT CROSS-SECTIONS AND BINDING-ENERGIES OBTAINED FROM XPS WIDE SCAN SPECTRA [J].

BRUNINX, E ;

VANEENBERGEN, A .

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1983, 38 (5-6) :821-830

[4] X-RAY PHOTOELECTRON SPECTROSCOPIC STUDY OF INTERACTION OF OXYGEN AND NITRIC-OXIDE WITH ALUMINUM [J].

CARLEY, AF ;

ROBERTS, MW .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1978, 363 (1714) :403-424

[5] SURFACE STUDIES OF THE TUNGSTEN DISPENSER CATHODE [J].

CHEN, DS ;

LINDAU, I ;

HECHT, MH ;

VIESCAS, AJ ;

NOGAMI, J ;

SPICER, WE .

APPLIED SURFACE SCIENCE, 1982, 13 (3-4) :321-328

[6]

DAVIS LE, 1976, HDB AUGER ELECTRON S

[7]

DEBOER JH, 1935, ELECTRON EMISSION AD

[8] CALCULATED CORE-LEVEL SENSITIVITY FACTORS FOR QUANTITATIVE XPS USING AN HP5950B SPECTROMETER [J].

ELLIOTT, I ;

DOYLE, C ;

ANDRADE, JD .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1983, 28 (04) :303-316

[9]

EYINK KG, 1984, APPL SURFACE SCI, V20, P215

[10] AUGER STUDIES COMPARING THE SURFACE CONCENTRATION OF BARIUM ON TUNGSTEN IMPREGNATED AND M-CATHODES [J].

FORMAN, R .

APPLIED SURFACE SCIENCE, 1985, 24 (3-4) :587-598

← 1 2 3 →