MODIFICATION OF AN EM6G ELECTRON-MICROSCOPE FOR X-RAY-MICROANALYSIS

被引：2

作者：

FITZGERALD, AG

STOREY, BE

机构：

[1] Carnegie Laboratory of Physics, University of Dundee, Dundee

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1979年 / 115卷 / JAN期

关键词：

D O I：

10.1111/j.1365-2818.1979.tb00153.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A dual purpose stage has been constructed for an EM6G 100 kV transmission electron microscope. With this stage the composition of thin films and bulk specimens can be determined by X‐ray microanalysis. With thin films a change of specimen cartridge then enables a full analysis of crystal defects in the film to be made using tilt controls incorporated in the stage. Modifications to the stage to reduce background effects in X‐ray microanalysis spectra are also described. The alternative use of this system in the bulk analysis of specimens by an X‐ray fluorescence technique is also discussed. 1979 Blackwell Science Ltd

引用

页码：73 / 80

页数：8

共 9 条

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