REEMITTED SPECTRA OF X-RAYS TRAVERSING A SOLID MATERIAL

Re-emitted spectra and re-emitted power of a source X-ray traversing a solid material have been formulated analytically. The re-emitted X-rays are due to the interaction of incident X-rays with material through Compton scattering, Rayleigh scattering and inner-shell vacancy radiative decay. Based on the formula, the re-emitted spectra of Compton and Rayleigh scattering are calculated for X-rays of the SPring-8 undulator (lambda(c) = 3 cm, L = 3.99 m, K = 1.0) traversing a Cu absorber with incident angle theta(i) = 3-degrees to the surface. The percentage of the re-emitted power due to Compton and Rayleigh scattering and fluorescence as a function of the incident angle is also discussed. The numerical result shows that the re-emitted power from the fluorescence process is dominant in this case.