HIGH-RESOLUTION IMAGES OF CELL-SURFACE USING A TAPPING-MODE ATOMIC-FORCE MICROSCOPE

被引：41

作者：

UMEMURA, K

ARAKAWA, H

IKAI, A

机构：

[1] Graduate Course of Biosciences, Tokyo

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1993年 / 32卷 / 11B期

关键词：

ATOMIC FORCE MICROSCOPE; TAPPING-MODE; CONTACT-MODE; CELL SURFACE; NEURON; HIGH-RESOLUTION; 3-DIMENSIONAL STRUCTURE;

D O I：

10.1143/JJAP.32.L1711

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We succeeded in obtaining high-resolution images of a cell surface using a tapping-mode atomic force microscope (tapping-mode AFM) in air. The resulting images resolved many particles of 40-80 nm in radius and distinguished regions where the particles formed clusters from other regions. Such images could not be obtained using a contact-mode atomic force microscope (contact-mode AFM) operated under the same conditions. The result demonstrates the possibility of cell surface research using the tapping-mode AFM with molecular resolution.

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收藏

页码：L1711 / L1714

页数：4

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