ANALYSIS OF AIR PARTICULATE DEPOSITS USING 2-MEV PROTONS

被引：7

作者：

BARFOOT, KM ^{[1
]}

MITCHELL, IV ^{[1
]}

ESCHBACH, HL ^{[1
]}

MASON, PI ^{[1
]}

GILBOY, WB ^{[1
]}

机构：

[1] UNIV SURREY,DEPT PHYS,MED & ENVIRONM PHYS,GUILDFORD GU2 5XH,SURREY,ENGLAND

来源：

JOURNAL OF RADIOANALYTICAL CHEMISTRY | 1979年 / 53卷 / 1-2期

关键词：

D O I：

10.1007/BF02517925

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Particle-induced X-ray emission (PIXE) analysis of the lighter elements in time-resolved air particulate deposits has been carried out. Minimum detection limits have been determined for 1.0, 2.0 and 3.5 MeVprotons. Quantitative PIXE analysis results, obtained with 2 MeV protons, are given for temporal variations in the elemental concentrations of Na, Al, Si, S, Cl, K, Ca and Fe. Rutherford backscattering (RBS) spectra were taken simultaneously with the PIXE spectra to provide information on lead concentrations and deposit thicknesses. The experimental problems associated with the quantitative analysis of light elements on cellulose acetate filters are described. The relationship between these results and meteorological data is discussed. © 1979 Akadémiai Kiadó.

引用

页码：255 / 271

页数：17

共 24 条

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