A NEW METHOD FOR THIN-FILM THICKNESS MEASUREMENT USING PIXE

被引：6

作者：

MIRANDA, J ^{[1
]}

OLIVER, A ^{[1
]}

MONTENEGRO, EC ^{[1
]}

机构：

[1] PONTIFICIA UNIV CATOLICA RIO DE JANEIRO,DEPT FIS,BR-20000 RIO DE JANEIRO,RJ,BRAZIL

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1989年 / 43卷 / 02期

关键词：

D O I：

10.1016/0168-583X(89)90039-6

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：203 / 209

页数：7

共 12 条

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