FRACTIONAL STATES IN FEW-ELECTRON SYSTEMS

被引:16
作者
HANSEN, W
SMITH, TP
LEE, KY
HONG, JM
KNOEDLER, CM
机构
关键词
D O I
10.1063/1.103018
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have observed fractional quantization of very few electrons confined in a semiconductor quantum dot using capacitance spectroscopy. The number of electrons per dot varies from 0 to about 40 as a function of bias on the quantum capacitors. The capacitance spectra have clear minima at gate voltages and magnetic fields, where the filling factors are 1/3 and 2/3. These measurements may allow direct comparison with few-particle calculations.
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页码:168 / 170
页数:3
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