DYNAMIC TESTING AND DIAGNOSTICS OF DIGITIZING SIGNAL ANALYZERS

This paper deals with a new dynamic testing method for effective bit number evaluation of digitizing signal analyzers. This technique is valid when, owing to particular working conditions, only a limited number of the sinewave test signal periods can be collected. In such a case, existing test methodologies can present problems for a correct application. The proposed method is based on a regression algorithm and, by virtue of employing the acquisition of a sinewave test signal for a time interval enclosing only three zero crossings of the sinewave, requires a very short computational time. After a brief summary of existing test methodologies, the performances and limits of the proposed method are analyzed and highlighted. To illustrate the application field of the described methodology, the preliminary simulated results of several devices and the real data relative to one digitizer are reported.