FORMATION OF EPITAXIAL TWINS BY PERFLUORO-N-ALKANE EVAPORATED ON ALKALI-HALIDE CRYSTAL

被引:8
作者
ISHIDA, K
HORIUCHI, T
KAI, S
MATSUSHIGE, K
机构
[1] KYOTO UNIV,FAC ENGN,DEPT ELECTR,SAKYO KU,KYOTO 60601,JAPAN
[2] KYUSHU UNIV,FAC ENGN,DEPT APPL SCI,HIGASHI KU,FUKUOKA 812,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1995年 / 34卷 / 2B期
关键词
EPITAXIAL GROWTH; EPITAXIAL TWIN; X-RAY DIFFRACTION; TOTAL REFLECTION; PERFLUORO-N-ALKANE; INPLANE STRUCTURE; MOLECULAR ORIENTATION; EVAPORATED THIN-FILM;
D O I
10.1143/JJAP.34.L240
中图分类号
O59 [应用物理学];
学科分类号
摘要
Structural evaluation of perfluoro-n-alkane, CF3(CF2)(18)CF3, thin films evaporated on KC1(001) single crystal was performed using a recently developed total reflection X-ray diffractometer. The molecular chain axes of the perfluoro-72-alkane crystals in the evaporated films were revealed to be normal to the substrate. where, the molecules assembled in hexagonal symmetry and grew epitaxially on the KC1(001) surface with fourfold symmetry, arranging their [100](hex) directions along the [100] directions of the KC1 crystal. Furthermore, detailed analysis suggested that the epitaxially grown crystals form a slightly distorted twin with facing their (1 $($) over bar$$ 430) planes, referred to here as an ''epitaxial twin''.
引用
收藏
页码:L240 / L243
页数:4
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