THICKNESS DEPENDENCE OF ELECTRICAL CONDUCTIVITY IN VACUUM DEPOSITED COPPER FILMS

被引：6

作者：

REALE, C

机构：

[1] Centro Ricerche Pellicole Sottili Metal Lux, Milan, Italy

来源：

PROCEEDINGS OF THE IEEE | 1969年 / 57卷 / 11期

关键词：

D O I：

10.1109/PROC.1969.7470

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The size dependence of the conductivity observed in vacuum condensed copper films 200–1500 Å thick was interpreted by applying the Sondheimer theory on the assumption that the scattering of the carriers by the film boundaries is partially elastic. The fraction of electrons specularly reflected at the surfaces was determined by a method based on the anomalous skin effect. Copyright © 1969 by The Institute of Electrical and Electronics Engineers, Inc.

引用

页码：2073 / &

共 12 条

[1] ABELES F, 1968, J PHYS RADIUM, V29, P37
[2] ABELES F, 1967, ADVANCED OPTICAL TEC, P168
[3] CAMPBELL DS, 1966, USE THIN FILMS PHYSI, P299
[4] Cottey A.A., 1968, THIN SOLID FILMS, V1, P297
[5] DRUMMETER LF, 1964, PHYSICS THIN FILMS, V2, P336
[6] HEAVENS OS, 1965, OPTICAL PROPERTIES T, P199
[7] ELECTRICAL CONDUCTIVITY OF THIN METALLIC FILMS WITH UNLIKE SURFACES
LUCAS, MSP
[J]. JOURNAL OF APPLIED PHYSICS, 1965, 36 (05) : 1632 - &
[8] NEUGEBAUER CA, 1967, MEAS TECH, P191
[9] NOSSEK R, 1966, BASIC PROBLEMS THIN, P550
[10] A NEW THEORY OF SIZE EFFECT IN ELECTRICAL CONDUCTION
PARROTT, JE
[J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1965, 85 (548P): : 1143 - &

← 1 2 →