A MODEL OF SUBSTRATE SURFACE-ROUGHNESS EFFECT ON THE ELECTRICAL-PROPERTIES OF THIN-FILMS

被引:3
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TOTH, L
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10.1016/0042-207X(87)90094-7
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T [工业技术];
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08 ;
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页码:103 / 106
页数:4
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[1]   The conductivity of thin metallic films according to the electron theory of metals [J].
Fuchs, K .
PROCEEDINGS OF THE CAMBRIDGE PHILOSOPHICAL SOCIETY, 1938, 34 :100-108
[2]  
HOFFMANN H, 1981, THIN SOLID FILMS, V85, P147, DOI 10.1016/0040-6090(81)90627-1
[4]   STATISTICAL MODEL FOR SIZE EFFECT IN ELECTRICAL CONDUCTION [J].
SOFFER, SB .
JOURNAL OF APPLIED PHYSICS, 1967, 38 (04) :1710-&
[5]   THE MEAN FREE PATH OF ELECTRONS IN METALS [J].
SONDHEIMER, EH .
ADVANCES IN PHYSICS, 1952, 1 (01) :1-42
[6]   ELECTRON-MICROSCOPIC AND AES STUDIES ON THIN-LAYERS OF NICR [J].
TOTH, L ;
BARNA, A ;
SAFRAN, G ;
MENYHARD, M ;
KORANYI, T .
VACUUM, 1983, 33 (1-2) :111-115