THICKNESS DEPENDENCE OF BREAKDOWN FIELD

被引：12

作者：

AGARWAL, VK ^{[1
]}

SRIVASTA.VK ^{[1
]}

机构：

[1] UNIV ROORKEE,DEPT PHYS,ROORKEE,INDIA

来源：

THIN SOLID FILMS | 1972年 / 13卷 / 02期

关键词：

D O I：

10.1016/0040-6090(72)90320-3

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：S23 / S24

页数：2

相关论文

共 6 条

[1] THICKNESS DEPENDENCE OF BREAKDOWN FIELD IN THIN FILMS
AGARWAL, VK
SRIVASTAVA, VK
[J]. THIN SOLID FILMS, 1971, 8 (05) : 377 - +
[2] ELECTRICAL BREAKDOWN IN THIN DIELECTRIC FILMS
FORLANI, F
MINNAJA, N
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1969, 6 (04): : 518 - +
[3] THICKNESS INFLUENCE IN BREAKDOWN PHENOMENA OF THIN DIELECTRIC FILMS
FORLANI, F
MINNAJA, N
[J]. PHYSICA STATUS SOLIDI, 1964, 4 (02): : 311 - 324
[4] SWITCHING AND BREAKDOWN IN FILMS
KLEIN, N
[J]. THIN SOLID FILMS, 1971, 7 (3-4) : 149 - +
[5] KLEIN N, 1969, ADVAN ELECTRON ELECT, V26, P409
[6] INTERFEROMETRIC AND X-RAY DIFFRACTION STUDY OF BUILT-UP MOLECULAR FILMS OF SOME LONG CHAIN COMPOUNDS
SRIVASTA.VK
VERMA, AR
[J]. SOLID STATE COMMUNICATIONS, 1966, 4 (08) : 367 - &