LATTICE-PARAMETER VARIATION IN INP RELATED TO THE DOPANT ELEMENT AND DOPING LEVEL

被引:5
作者
KNAUER, A [1 ]
KRAUSSLICH, J [1 ]
KITTNER, R [1 ]
STASKE, R [1 ]
BARWOLFF, A [1 ]
机构
[1] UNIV JENA,SEKT PHYS,O-6900 JENA,GERMANY
关键词
D O I
10.1002/crat.2170250417
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
The variation of the lattice constant was determined across (001) InP wafers from 〈111〉 grown LEC INP: S and InP: Sn + Ga + As monocrystals. The variation correlates to the free carrier distribution. The enrichment of dopants results in lattice spacing in the crystal core (especially for InP: Sn + Ga + As), which occupy a larger region as dopant enrichment do. Copyright © 1990 WILEY‐VCH Verlag GmbH & Co. KGaA
引用
收藏
页码:441 / 449
页数:9
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