ELECTRICAL-RESISTIVITY AND THERMAL-EXPANSION OF LA1-XCEXSN3 AND CELN3-YSNY

被引：13

作者：

MAURY, A

SCOBORIA, P

CROW, JE

MIHALISIN, T

机构：

[1] Department of Physics, Temple University, Philadelphia

来源：

JOURNAL OF APPLIED PHYSICS | 1979年 / 50卷 / 11期

关键词：

D O I：

10.1063/1.326848

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have measured the temperature dependence of the electrical resistivity and thermal expansion of La1-xCexSn3, CeSn 2In and LaSn2In from 300K to 1.5K. The CeSn3 system is interesting because a variety of previous measurements seem to suggest that the Ce ions within this system may display intermediate valence behavior. Both the thermal expansion measurements and resistivity data for these systems are presented and compared to both other known mixed valence systems and predictions for concentrated Kondo systems.

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页码：7572 / 7574

页数：3

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