EFFECTS OF ANNEALING AND GEOMETRY OPTIMIZATION ON A THIN MAGNETORESISTIVE HEAD

被引：4

作者：

CIUREANU, P ^{[1
]}

KORONY, G ^{[1
]}

机构：

[1] INST PHYS & MAT TECHNOL,BUCHAREST,ROMANIA

来源：

SENSORS AND ACTUATORS | 1988年 / 13卷 / 03期

关键词：

HEAT TREATMENT - Annealing - MAGNETIC MATERIALS - Thin Films - MAGNETOELECTRIC EFFECTS - NICKEL IRON ALLOYS - Thin Films - OPTIMIZATION;

D O I：

10.1016/0250-6874(88)85003-0

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

The magnetic and electric properties of thin NiFe films were investigated in relation to the annealing temperature and time, in order to obtain suitable magnetoresistive (MR) sensors for digital purposes. An insulated-shunt biasing method was used to linearize the sensor. The bias field, generated by a sheet of elementary currents, was computed as a function of the distance between the conductor and the ferromagnetic layers. The line density of the bias current for an efficient linearization and the optimum thickness of the conductor layer to avoid device heating were thus derived.

引用

页码：229 / 241

页数：13

共 12 条

[1]

APOSTOL P, 1985, 7TH P C ADV PHYS IAS, P314

[2]

BROCK GW, 1976, Patent No. 3967368

[3] THE MAGNETORESISTANCE, RESISTIVITY AND STRESS IN NI-FE FILMS EVAPORATED IN ULTRAHIGH-VACUUM [J].